Welcome to FIB International, Inc., a service and consulting institute for the Focused Ion Beam (FIB) technologies, testing and failure analysis (FA) of microelectronic devices, and PCB design, layout, FAB, and assembly. Founded in 1996, our company quickly became the leader of FIB technologies thanks to our highly experienced staff and state-of-the-art equipments.

We provide a large selection of failure analysis and debugging services mainly targeted towards the electronic industry. From device preparation to FIB modification to PCB design and layout, we offer your company a one-stop shop for all your FA and debugging needs. Our well-trained staff can help you with designing and performing complicated device modifications; our FA experts can help you locate any process defects on ICs and Recording Heads. The company's founder, Mr. Sean Lee, has decades of experiences in the analytical field and is recognized as one of the leading experts in FIB technologies by our customers and FIB system vendors.

We consult for FEI/Micrion, Schlumberger, IBM, and other companies in the areas of FIB system evaluation and demonstration, training, and lab setup and operation.

We also offer a variety of FIB training classes. From theory to hands-on operation, our classes and seminars can help you gain a comprehensive and in-depth understanding of FIB technologies. The students trained by our company are spread all over the world, working for different IC companies, service labs, and FIB vendors as their key technical personnel.

Created by and growing with these fascinating technologies, our company is committed to achieve excellence for our customers from all sectors of the business community.